@article{doi:10.1063/1.4975377, author = {Maryam Farmand and Richard Celestre and Peter Denes and A. L. David Kilcoyne and Stefano Marchesini and Howard Padmore and Tolek Tyliszczak and Tony Warwick and Xiaowen Shi and James Lee and Young-Sang Yu and Jordi Cabana and John Joseph and Harinarayan Krishnan and Talita Perciano and Filipe R. N. C. Maia and David A. Shapiro}, title = {Near-edge X-ray refraction fine structure microscopy}, journal = {Applied Physics Letters}, volume = {110}, number = {6}, pages = {063101}, year = {2017}, doi = {10.1063/1.4975377}, URL = {http://dx.doi.org/10.1063/1.4975377}, eprint = {http://dx.doi.org/10.1063/1.4975377} }